Advances in image processing and understanding: A by Alan C. Bovik, Chang Wen Chen, Dmitry B. Goldgof, Thomas S.

By Alan C. Bovik, Chang Wen Chen, Dmitry B. Goldgof, Thomas S. Huang

Directed in the direction of photograph processing researchers, together with educational school, graduate scholars and researchers, in addition to towards pros operating in software parts.

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17 Random noise In general is an unpredictable (non-deterministic) disturbance interfering with a signal, described by its frequency spectrum and its amplitude statistical properties. In an ADC the disturbed signal may be either the input or the output signals. 18 Residuals In a sine wave curve fitting procedure the residuals result from the difference between the recorded data and the fitted function. , the sum of all non-fundamental components in the range from DC (excluded) up to half 38 ADC DYNAMIC CHARACTERISATION the sampling frequency ( f2s ).

It can be designated also as phase noise, and used interchangeably with aperture uncertainty. Jitter is due to rapid, short-term, random fluctuations in the phase of a wave, caused by time-domain instabilities. It leads to short-term frequency variations in the clock (or input signal) frequency which appear as energy at frequencies other than the carrier. 5 × S(f )] where S(f ) is the spectral density of phase fluctuations, or as a rms deviation in a specified frequency from the carrier. 15). 8 Processing gain (PG) When applied to a window, the ratio of the output signal to noise floor ratio, to the input signal to noise ratio.

In an actual ADC the measured error is generated by quantisation noise together with other sources of noise such as jitter, non-linearities, fixed pattern noise, reference voltage noise, power supply noise, missing codes, and thermal noise. The Nef degrades with an increasing of the sampling frequency and its worst-case value occurs at the maximum specified sampling frequency (ffsmax ) for an input frequency close or above one half of fsmax . 21). 7 Gain Gain (G) The slope of the fitting straight line of the transfer characteristic, or of a specified part of it, expressed as the quotient of a change in digital output quantity (stated in the input quantity dimensions) by the change in analogue input quantity producing it .

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